Format: MAT, MATLABPublisher: IEEE DataPortPublication Date of the Electronic Edition: 01/05/2026
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ISBN: 10.21227/x573-hv10
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Description
The file contains reliability test results for a GaN device, a SiC device, and an IGBT, as well as data related to a DC–DC buck converter simulated in MATLAB.
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Delivery time: Instant
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